"OSA Chapter Seminar: Detectors’ Challenges for Semiconductors’ Inspection and Metrology"

Date: 
Tue, 24/11/201516:00-17:00
Location: 
Danciger B building, Seminar room
Lecturer: Mr. Tal Kuzniz
Affiliation: Applied materials Inc.
Abstract:
Have you ever wondered about the physics
used in the semiconductor industry? Tal
Kuzniz, Applied Materials’ head of
detectors and mask inspection team, will
speak about the unique technological
challenges he and his team faces, how to
address them, and why it’s probably very
different from what you may think. The
discussion will introduce semiconductor
processing, market requirements, inspection
and metrology detectors, and how an
inspired team delivers innovative solutions.
Tal Kuzniz has a B.Sc. and M.Sc. from the
Tel-Aviv University and over 20 years of
experience in development positions at
electro-optics companies.